Element Oakland Mills (formerly PCTEST)

More labs in this area: EMC testing in Maryland

Columbia, Maryland, United States

7185 Oakland Mills Road, Columbia, Maryland, 21046, United States

About

Element's Columbia, Maryland laboratory — formerly known as PCTEST Columbia — is a Connected Technologies testing and certification facility located at 7185 Oakland Mills Road, strategically within walking distance of the FCC's laboratory in Columbia and a short drive from Washington, D.C. The lab was founded in 1989 by a group of former FCC engineers to serve the growing need for independent regulatory testing of technology products. The facility has established itself as a specialist in wireless device testing and certification, particularly for the mobile and cellular industry. Core capabilities include EMC/EMI testing and certification, RF testing and certification, Specific Absorption Rate (SAR) testing, Hearing Aid Compatibility (HAC) testing, Over the Air (OTA) testing, and 4G/LTE conformance testing. The lab also performs field interoperability testing (FIT), RF parametric and protocol testing, lithium battery testing, SunSpec Alliance certification, and Verizon Wireless Open Development certification testing. The Columbia lab became a Verizon Wireless Authorized Test Facility for 4G/LTE in 2011, and today serves as the preferred independent test house for many major cell phone, smartphone, and electronic device manufacturers worldwide. As part of the Element Materials Technology network, clients at this location also have access to Element's broader global resources spanning materials testing, product qualification, environmental simulation, and certification services across numerous industries.

Accreditations

Accreditation
ISO/IEC 17025
A2LA

Testing Services

Test Type	Applicable Standards
Radiated Emissions	CFR 47 FCC Part 15, Subpart B (using ANSI C63.4:2014), CFR 47 FCC Part 18 (using MP-5:1986), IEC/CISPR 11, EN 55011, KS C 9811, CISPR 14-1 (excluding click and power disturbance), IEC/EN 55014-1, KS C 9814-1, CISPR 15, IEC/EN 55015, IEC/CISPR 22, IEC/EN 55022, IEC/EN 55032, CISPR 32, EN 55103-1, KS C 9832, AS/NZS CISPR 11, AS/NZS CISPR 32, ICES-001, ICES-003, ICES-005, VCCI V-3, VCCI-CISPR 32 (up to 6 GHz), CNS 13803, CNS 13783-1, CNS 13438, CNS 15936 (up to 6 GHz), TCVN 7189 (2009), 3GPP TS 36.124, 3GPP TS 51.010-1, Section 12 (Conducted and Radiated Spurious Emissions), 3GPP TS 38.124, ETSI TS 136 124 LTE; ETSI TS 151 010-1, ETSI TS 138.124 5G; ETSI TS 134.124 3G, Digital Cellular Telecommunications System (Phase 2+) (GSM)
Conducted Emissions	CFR 47 FCC Part 15, Subpart B (using ANSI C63.4:2014), CFR 47 FCC Part 18 (using MP-5:1986), IEC/CISPR 11, EN 55011, KS C 9811, CISPR 14-1 (excluding click and power disturbance), IEC/EN 55014-1, KS C 9814-1, CISPR 15, IEC/EN 55015, IEC/CISPR 22, IEC/EN 55022, IEC/EN 55032, CISPR 32, EN 55103-1, KS C 9832, AS/NZS CISPR 11, AS/NZS CISPR 32, ICES-001, ICES-003, ICES-005, VCCI V-3, VCCI-CISPR 32 (up to 6 GHz), CNS 13803, CNS 13783-1, CNS 13438, CNS 15936 (up to 6 GHz), TCVN 7189 (2009), 3GPP TS 36.124, 3GPP TS 51.010-1, Section 12 (Conducted and Radiated Spurious Emissions), 3GPP TS 38.124, ETSI TS 136 124 LTE; ETSI TS 151 010-1, ETSI TS 138.124 5G; ETSI TS 134.124 3G, Digital Cellular Telecommunications System (Phase 2+) (GSM)
Radiated Immunity	IEC 61000-4-3, EN 61000-4-3, KS C 9610-4-3
Conducted Immunity	IEC 61000-4-6, EN 61000-4-6, KS C 9610-4-6
ESD	IEC 61000-4-2, EN 61000-4-2, KS C 9610-4-2
EFT/Burst	IEC 61000-4-4, EN 61000-4-4, KS C 9610-4-4
Surge Immunity	IEC 61000-4-5, EN 61000-4-5, KS C 9610-4-5
Harmonics & Flicker	IEC 61000-3-2, EN 61000-3-2, KS C 9610-3-2, IEC 61000-3-3, EN 61000-3-3, KS C 9610-3-3
Voltage Dips/Interrupts	IEC 61000-4-11, EN 61000-4-11, KS C 9610-4-11
Power Frequency Magnetic Field	IEC 61000-4-8, EN 61000-4-8, KS C 9610-4-8

Industries Served

Industry
Aerospace & Defense
Consumer Electronics
Information Technology
Radio & Wireless
Telecommunications