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JEL Limited

JEL Limited

Abiko, Chiba, Japan

+81 4-7188-5333

3032 Nakabyo, Abiko, Chiba, 270-1121, Japan

About

JEL Limited operates a technical centre at Nakabyo in Abiko, Chiba Prefecture, north-east of Tokyo, and is both an EMC test laboratory and a maker of EMC test equipment. Its most distinctive asset is its site inventory: three anechoic chambers backed by open area test sites at three, ten and thirty metres. A 30-metre open area test site is a genuine rarity anywhere in the world - it exists to measure equipment whose physical size or emission profile makes even a 10-metre separation inadequate, and an OATS remains the reference method against which chamber site attenuation is validated, so JEL can resolve disputed chamber results rather than only produce them. The laboratory is accredited to ISO/IEC 17025 by A2LA, the American Association for Laboratory Accreditation - an unusual choice for a Japanese laboratory, which typically goes to JAB or VLAC, and one that routes reports straight into North American acceptance - and holds ISO 9001. Testing spans on-site, pre-compliance and full-compliance work, covering radiated and conducted emissions, harmonics and flicker, radiated and conducted immunity, electrostatic discharge, fast transient burst, surge, voltage dips and interruptions, and magnetic field immunity. Accredited standards run across CISPR 11, 14-1, 14-2 and 32, the IEC 61000-3 and 61000-4 series including 61000-3-11 and -3-12, the IEC 61000-6 generic standards, IEC 60601-1-2 for medical equipment and EN 61326-1 for measurement and laboratory equipment. International approvals supported are CE, FCC, VCCI and Taiwan's BSMI. Customers describe it as a third-party organisation handling IEC 60601-1-2 medical EMC and noise immunity evaluation together with EMC remediation engineering. Industries served are household appliances, industrial equipment, ISM equipment and medical devices. Specialisations are the 30-metre open area test site, medical device EMC, A2LA-routed North American acceptance, and EMC countermeasure engineering.

Accreditations

Accreditation
ISO/IEC 17025
A2LA
VCCI (Japan)
FCC Listed
BSMI (Taiwan)

Testing Services

Test TypeApplicable Standards
Radiated EmissionsCISPR 11, EN 55011, CISPR 14-1, EN 55014-1, CISPR 32, EN 55032, VCCI-CISPR 32, FCC Part 15B, FCC Part 18, ANSI C63.4, IEC 61000-6-3, IEC 61000-6-4, IEC 60601-1-2, EN 61326-1
Conducted EmissionsCISPR 11, EN 55011, CISPR 14-1, EN 55014-1, CISPR 32, EN 55032, VCCI-CISPR 32, FCC Part 15B, FCC Part 18, ANSI C63.4, IEC 61000-6-3, IEC 61000-6-4, IEC 60601-1-2, EN 61326-1
Radiated ImmunityIEC 61000-4-3, EN 61000-4-3, CISPR 14-2, EN 55014-2, EN 55024, IEC 61000-6-1, IEC 61000-6-2, IEC 60601-1-2, EN 61326-1
Conducted ImmunityIEC 61000-4-6, EN 61000-4-6, CISPR 14-2, EN 55014-2, EN 55024, IEC 61000-6-1, IEC 61000-6-2, IEC 60601-1-2, EN 61326-1
ESDIEC 61000-4-2, EN 61000-4-2, IEC 60601-1-2
EFT/BurstIEC 61000-4-4, EN 61000-4-4, IEC 60601-1-2
Surge ImmunityIEC 61000-4-5, EN 61000-4-5, IEC 60601-1-2
Harmonics & FlickerIEC 61000-3-2, EN 61000-3-2, IEC 61000-3-3, EN 61000-3-3, IEC 61000-3-11, IEC 61000-3-12
Voltage Dips/InterruptsIEC 61000-4-11, EN 61000-4-11, IEC 60601-1-2
Power Frequency Magnetic FieldIEC 61000-4-8, EN 61000-4-8, IEC 60601-1-2
Pre-Compliance TestingCISPR 32, CISPR 11, IEC 61000-4-3, ANSI C63.4, VCCI-CISPR 32
Medical Device EMCIEC 60601-1-2, EN 60601-1-2, JIS T0601-1-2, EN 61326-1

Certifications / Marks

Certification
CE
FCC
VCCI
BSMI
A2LA accredited reports
ISO 9001

Industries Served

Industry
Household Appliances
Industrial Equipment
Medical Devices
Consumer Electronics
Information Technology

Major Equipment

Equipment
Three anechoic chambers
30 m open area test site (OATS)
10 m open area test site
3 m open area test site
EMI receiver
Spectrum analyser
LISN
CDN
ESD simulator
EFT/burst generator
Surge generator
Harmonics and flicker analyser
Power frequency magnetic field coil
RF immunity amplifiers and antennas
EMC test equipment manufacturing capability (in-house)
EMC countermeasure and remediation engineering bench
On-site measurement capability