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KEC Electronic Industry Development Center

KEC Electronic Industry Development Center

Seika, Kyoto, Japan

+81 774-93-4563

3-2-2 Hikaridai, Seika-cho, Soraku-gun, Seika, Kyoto, 619-0237, Japan

Additional locations (1)

KEC Keihanna Test Center - new anechoic chamber building: 3-2-33 Hikaridai, Seika-cho, Soraku-gun, Seika, Kyoto, 619-0237, Japan+81 774-29-9028
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About

KEC, the Kansai Electronic Industry Development Center, is a general incorporated association based at Hikaridai in Seika, Kyoto Prefecture - in the Keihanna Science City research cluster between Kyoto, Osaka and Nara - and it occupies a position no other laboratory in this directory holds. Alongside running its own Keihanna Test Center, with an anechoic chamber complex including a newly built chamber block, it is an accredited proficiency testing provider: the Japan Accreditation Board accredits it to ISO/IEC 17043 under number PTP00060 for EMC emissions proficiency testing. That makes KEC the body other Japanese laboratories use to demonstrate measurement competence for their own ISO/IEC 17025 accreditation. Its FY2026 schemes cover radiated emissions from 30 MHz to 1000 MHz, radiated emissions from 6 GHz to 18 GHz, magnetic field radiated emission by the loop antenna method below 30 MHz, CISPR 25 radiated emissions by the ALSE method to 1000 MHz, CISPR 25 conducted emissions by both voltage and current methods, and cable insertion loss evaluation outside the accredited scope. Results are evaluated with robust statistics under ISO 13528 using z-scores, participants are identified only by laboratory code, and no corrective action or re-test is required - the scheme is diagnostic rather than punitive. Its own testing covers consumer, industrial, medical and radio equipment, radio characteristic measurement, vehicle-mounted equipment, military and aircraft equipment, shield material testing, anechoic chamber characterisation by NSA and SVSWR, and environmental and reliability testing. Product safety work includes PSE conformity confirmation, S-Mark certification testing, structural pre-check and CE marking assessment. KEC also administers the iNARTE certification examinations in Japan - iNARTE-EMC, iNARTE-PS and EMC design engineer - and publishes translated standards and an EMC and product safety database. Specialisations are ISO/IEC 17043 EMC proficiency testing, chamber validation by NSA and SVSWR, shield material measurement, and engineer certification.

Accreditations

Accreditation
ISO/IEC 17025
iNARTE
VCCI (Japan)

Testing Services

Test TypeApplicable Standards
Radiated EmissionsCISPR 11, CISPR 14-1, CISPR 15, CISPR 32, CISPR 25, CISPR 16-1-4, CISPR 16-2-3, VCCI-CISPR 32, EN 55011, EN 55032, FCC Part 15B, ANSI C63.4, MIL-STD-461G RE102, RTCA DO-160G Section 21, ISO 13528
Conducted EmissionsCISPR 11, CISPR 14-1, CISPR 15, CISPR 32, CISPR 25, CISPR 16-1-2, CISPR 16-2-1, VCCI-CISPR 32, EN 55011, EN 55032, FCC Part 15B, MIL-STD-461G CE102, RTCA DO-160G Section 21
Radiated ImmunityIEC 61000-4-3, CISPR 35, CISPR 14-2, IEC 61547, IEC 61000-6-1, IEC 61000-6-2, ISO 11452-2, MIL-STD-461G RS103, RTCA DO-160G Section 20
Conducted ImmunityIEC 61000-4-6, CISPR 35, CISPR 14-2, IEC 61000-6-1, IEC 61000-6-2, ISO 11452-4, MIL-STD-461G CS114
Radiated SusceptibilityMIL-STD-461G RS101, MIL-STD-461G RS103, ISO 11452-2
Conducted SusceptibilityMIL-STD-461G CS101, MIL-STD-461G CS114, MIL-STD-461G CS116, ISO 7637-2
ESDIEC 61000-4-2, ISO 10605
EFT/BurstIEC 61000-4-4
Surge ImmunityIEC 61000-4-5
Harmonics & FlickerIEC 61000-3-2, JIS C 61000-3-2, IEC 61000-3-3
Voltage Dips/InterruptsIEC 61000-4-11
Power Frequency Magnetic FieldIEC 61000-4-8, CISPR 16-1-4 loop antenna method, MIL-STD-461G RS101
Bulk Current Injection (BCI)ISO 11452-4, MIL-STD-461G CS114
Pre-Compliance TestingCISPR 32, CISPR 25, IEC 61000-4-3, VCCI-CISPR 32, ISO/IEC 17043, ISO 13528
Radio Equipment TestingJapan Radio Act technical regulations, ARIB STD-T66, ETSI EN 300 328, FCC Part 15.247
Military EMCMIL-STD-461F, MIL-STD-461G, NDS (Japan Ministry of Defense Standard)
MIL-STD-461MIL-STD-461F, MIL-STD-461G
Commercial Aviation EMCRTCA DO-160G Section 20, RTCA DO-160G Section 21
Automotive Component EMCCISPR 25, ISO 11452-2, ISO 11452-4, ISO 7637-2, ISO 10605
Medical Device EMCIEC 60601-1-2, JIS T0601-1-2, IEC 61326-1
Environmental TestingIEC 60068-2-1, IEC 60068-2-2, IEC 60068-2-14, IEC 60068-2-30, IEC 60068-2-78, IEC 60529
Mechanical TestingIEC 60068-2-6, IEC 60068-2-27, IEC 60068-2-64
Product SafetyJapan Electrical Appliance and Material Safety Act (PSE), IEC 60335-1, JIS C 9335-1, IEC 62368-1, IEC 61010-1, IEC 60598-1

Certifications / Marks

Certification
PSE (Diamond and Circle)
S-Mark
CE
VCCI
JAB ISO/IEC 17043 proficiency testing provider PTP00060
iNARTE-EMC examination centre
iNARTE-PS examination centre
iNARTE EMC design engineer examination centre

Industries Served

Industry
Consumer Electronics
Industrial Equipment
Medical Devices
Radio & Wireless
Automotive
Military
Aerospace & Defense
Information Technology
Lighting Products
Household Appliances

Major Equipment

Equipment
Keihanna Test Center anechoic chamber complex including a new chamber building
10 m method anechoic chamber
Shielded rooms
ISO/IEC 17043 accredited EMC emissions proficiency testing scheme (JAB PTP00060)
Proficiency testing artefacts for 30 MHz - 1000 MHz radiated emissions
Proficiency testing artefacts for 6 GHz - 18 GHz radiated emissions
Loop antenna magnetic field radiated emission set-up (below 30 MHz)
CISPR 25 ALSE method radiated emissions set-up to 1000 MHz
CISPR 25 conducted emissions voltage and current method set-ups
Cable insertion loss evaluation bench
Anechoic chamber characterisation by NSA and SVSWR
Shield material measurement apparatus
EMI receiver
Spectrum analyser
LISN
CDN
BCI injection probes
ESD simulator
EFT/burst generator
Surge generator
RF immunity amplifiers and antennas
Environmental and reliability test chambers
Product safety test benches and structural pre-check facility