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Characterization of Human Metal Model ESD Based on Radiated Susceptibility

Published by Amber Precision Instruments

This paper investigates the radiated susceptibility of PCBs to Human Metal Model (HMM) ESD events per IEC 61000-4-2. Circuit and full-wave SPICE/CST simulation models of HMM, HBM, and TLP generators are developed and validated. The coupling mechanism between an HMM ESD generator and a 50Ω microstrip is compared with near-field TLP injection per ANSI/ESD SP14.5-2015, showing good waveform agreement. An empirical formula is derived to correlate HMM voltage settings with equivalent TLP voltage, accounting for probe factor, probe-to-signal distance, and near-field attenuation (~1/r^1.66 for TLP probes, ~1/R^1.25 for the ESD generator).